CALCE Announces Presentations for 2026 Counterfeit Symposium

Devon Richman

The technical committee of the 2026 CALCE/SMTA Counterfeit Symposium has selected key presentations that reflect the event's focus. The program will address counterfeit avoidance and testing standards, applications of AI in inspection and tracking, decision-making related to counterfeit parts, and other current challenges in the field. It will also feature two panel discussions: one on the new SAE 6171 counterfeit detection standard suite, including its expanded tools and defect coverage, and another on the renewed challenge of component allocations and long lead times in the distribution industry.

Among the featured presentations are “Expanding Trusted Microelectronics: Meeting Future Needs” by David Chesebrough of Defined Business Solutions, examining how trusted suppliers and secure processes strengthen assurance in defense systems; “Advanced Detection Techniques for Counterfeit Electronic Components” by Dr. Nicholas Williams of SMT Corp., focused on advanced inspection and testing methods for identifying counterfeit parts; “AI Enhanced Physical Inspection for Counterfeit Microelectronics” by Charles G. Woychik of NHanced Semiconductors and Navid Asadizanjani of the University of Florida, highlighting AI-driven approaches to detect tampering and protect semiconductor hardware; and “A Novel Anti-Counterfeiting Technology for Semiconductor Supply Chains Using Inkjet-Printed Silicon Nanoparticle Ink” by Tadatomo Yamada of Lintec Corporation, introducing a nanoparticle-based authentication method for verifying semiconductor components.

Together, these presentations underscore the symposium’s continued focus on practical and emerging approaches to counterfeit mitigation, trusted microelectronics, inspection technology, and semiconductor supply-chain security.

Please check this page again for future updates.

For more information about the symposium, contact Dr. Diganta Das.

Published April 16, 2026