Event
Root Cause Failure Analysis of Electronics: A Four-Day, Hands-On Short Course
Tuesday, November 15, 2022
University of Maryland, College Park
Bharadwaj Chukkala
301 405 2410
bchukkal@umd.edu
https://calce.umd.edu/root-cause-failure-analysis-electronics
This intensive 4-day course will cover specimen preparation and materials analysis techniques applicable to electronic assemblies, components, and devices. The course consists of a combination of classroom instruction, demonstrations, and hands-on laboratory training. Lecture topics include physics-of-failure root cause analysis, guidelines for the selection of analytical tools, practical instruction on laboratory techniques, and case studies drawn from CALCE’s research. The laboratory portion of the course includes demonstrations and step-by-step hands-on sample preparation using metallographic techniques on failure analysis and inspection equipment. In addition, a number of important non-destructive and destructive analysis techniques will be demonstrated. This is your opportunity to learn all about the latest failure analysis methods and critical failure mechanisms in electronics.
Each course attendee is invited to submit one sample to CALCE at least three weeks before the course starts. Several of the submitted samples will be prepared and analyzed in advance, for use during course demonstrations. Some of the other samples will also be used for hands-on training sessions during the course, to illustrate specimen preparation procedures and analysis techniques. All unused samples will be returned. However, no guarantee can be offered that any specific sample will be used during the course.
